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Screensize: 640 x 480 800 x 600 1024 x 768 1280 x 1024 UserName: Password: Anti-Spam Code: Format Mode: Basic  Help  Prompt  Format: Font Andale Mono Arial Arial Black Book Antiqua Century Gothic Comic Sans MS Courier New Georgia Impact Lucida Console Script MT Bold Stencil Tahoma Times New Roman Trebuchet MS Verdana   Size 1 2 3 4 5 6   Color Black Red Yellow Pink Green Orange Purple Blue Beige Brown Teal Navy Maroon LimeGreen Message: * HTML is OFF * Forum Code is ON Smilies [quote][i]Originally posted by FelixLam[/i] [br]Origin Ver. and Service Release (Select Help-->About Origin): 9.0.0 (32-bit) SR2 Operating System: Win7 Hi, I need to analyze a batch of nearly identical X-ray line profiles (ca 200 separate line profiles) with a psdvoigt1 function. Each profile contains two peaks. No problem so far but: In X-ray diffraction analysis every peak is an overlap between a Ka1 and a Ka2 peak (from the characteristic radiation of the X-rays). Only the Ka1 peak is of physical interest and therefore both peaks have to be fit from the line profile to isolate the Ka1 peak. The position of the Ka2 peak can be calculated from the position of the Ka1 peak and the amplitude of the Ka2 peak is always half the amplitude of the Ka1 peak. There is no possibility to detect the hidden peaks with the normal peak finder (they nicely overlap with the Ka1 peak) and therefore I would like to do the following: 1. Find the peak position of both Ka1 peaks (That's easy) 2. Calculate the peak positions of both Ka2 peaks from the positions of the Ka1 peaks 3. Constrain the amplitude of the Ka2 peaks to the amplitude of the Ka1 peaks 4. Fit the 4 peaks in each line profile with the psdvoigt1 function Is there a possibility to do this with OriginPro? Regards Felix [/quote]   Check here to include your profile signature. Check here to subscribe to this topic.